Wide gap semiconductor related facilities

Optical-capacitance-transinet spectroscopy measurement system

(It also works as DLTS system)

DLTS measurement system

(Capacitance, current and fast-pulse measurement)

Microwave photocunductivity decay

and Time-resolved photoluminescence

Furnace (bigger)

(Maximum temperature 1100oC)

High temperature oven

Infrared furnace

(Maximum temperature 1600oC)

High voltage prober

Carrier lifetime mapping system using free carrier absorption

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